Characterisation of a Non-Organofunctional Silane Film Deposited on Al, Zn and Al-43.4Zn-1.6Si Alloy Coated Steel, Part II. Interfacial Characterization by ToF-SIMS and AES

Document identifier: oai:dalea.du.se:2675
Keyword: Metal substrates; silane films; AES; interfacial bonding; ToF-SIMS
Publication year: 2001
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Abstract:

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) has been used to analyse the interface between a non-organofunctional silane and three different metal substrates (aluminium, zinc and an aluminium-zinc alloy). Ion etching using Ga+ ions was used to expose the interfacial region. Ion fragments from the samples were examined carefully where supposed metal-oxygen-silicon ion fragments should appear in the mass spectra. From high mass resolution spectra it was concluded that there exists an AlOSi+ ion fragment at nominal mass m/z = 71 amu on the aluminium and aluminium-zinc alloy substrates and a ZnOSi+ ion fragment at nominal mass m/z = 108 amu on the zinc and aluminium-zinc alloy substrates. These results are further enhanced by the fact that the characteristic ion pattern of ZnOSi+-type ion fragments, composed of different naturally stable zinc and silicon isotopes, in the mass range m/z = 108-112 amu showed the expected relative peak height relations. The presence of these metal-oxygen-silicon ion fragments is a strong indication that chemical interaction between the silane and the metal substrates exists and that the nature of this interaction is due to the formation of a covalent bond between the silane and the metal substrate. Copyright © 2001 John Wiley & Sons, Ltd.

Authors

Ulf Bexell

Högskolan Dalarna; Materialvetenskap
Other publications >>

Mikael Olsson

Högskolan Dalarna; Materialvetenskap
Other publications >>

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    header: 
        identifier: oai:dalea.du.se:2675
        datestamp: 2021-04-15T12:53:00Z
        setSpec: SwePub-du
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                version: 3.7
            recordInfo: 
                recordContentSource: du
                recordCreationDate: 2007-04-04
            identifier: http://urn.kb.se/resolve?urn=urn:nbn:se:du-2675
            titleInfo: 
                @attributes: 
                    lang: eng
                title: Characterisation of a Non-Organofunctional Silane Film Deposited on Al Zn and Al-43.4Zn-1.6Si Alloy Coated Steel Part II. Interfacial Characterization by ToF-SIMS and AES
            abstract: 
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) has been used to analyse the interface between a non-organofunctional silane and three different metal substrates (aluminium zinc and an aluminium-zinc alloy). Ion etching using Ga+ ions was used to expose the interfacial region. Ion fragments from the samples were examined carefully where supposed metal-oxygen-silicon ion fragments should appear in the mass spectra. From high mass resolution spectra it was concluded that there exists an AlOSi+ ion fragment at nominal mass m/z = 71 amu on the aluminium and aluminium-zinc alloy substrates and a ZnOSi+ ion fragment at nominal mass m/z = 108 amu on the zinc and aluminium-zinc alloy substrates. These results are further enhanced by the fact that the characteristic ion pattern of ZnOSi+-type ion fragments composed of different naturally stable zinc and silicon isotopes in the mass range m/z = 108-112 amu showed the expected relative peak height relations. \nThe presence of these metal-oxygen-silicon ion fragments is a strong indication that chemical interaction between the silane and the metal substrates exists and that the nature of this interaction is due to the formation of a covalent bond between the silane and the metal substrate. Copyright © 2001 John Wiley & Sons Ltd.

            subject: 
                @attributes: 
                    lang: eng
                topic: metal substrates; silane films; AES; interfacial bonding; ToF-SIMS
            language: 
                languageTerm: eng
            genre: 
                publication/journal-article
                ref
            note: 
                Published
                2
            name: 
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                        type: personal
                        authority: du
                    namePart: 
                        Bexell
                        Ulf
                    role: 
                        roleTerm: aut
                    affiliation: 
                        Högskolan Dalarna
                        Materialvetenskap
                    nameIdentifier: ubx
                    @attributes: 
                        type: personal
                        authority: du
                    namePart: 
                        Olsson
                        Mikael
                    role: 
                        roleTerm: aut
                    affiliation: 
                        Högskolan Dalarna
                        Materialvetenskap
                    nameIdentifier: mol
            originInfo: 
                dateIssued: 2001
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                    type: host
                titleInfo: 
                    title: Surface and Interface Analysis
                identifier: 
                    0142-2421
                    1096-9918
                part: 
                    detail: 
                            @attributes: 
                                type: volume
                            number: 31
                            @attributes: 
                                type: issue
                            number: 3
                    extent: 
                        start: 223
                        end: 231
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