Characterisation of a Non-Organofunctional Silane Film Deposited on Al, Zn and Al-43.4Zn-1.6Si Alloy Coated Steel, Part II. Interfacial Characterization by ToF-SIMS and AES
Document identifier: oai:dalea.du.se:2675
Keyword: Metal substrates; silane films; AES; interfacial bonding; ToF-SIMSPublication year: 2001Relevant Sustainable Development Goals (SDGs):
The SDG label(s) above have been assigned by OSDG.aiAbstract: Time-of-flight secondary ion mass spectrometry (ToF-SIMS) has been used to analyse the interface between a non-organofunctional silane and three different metal substrates (aluminium, zinc and an aluminium-zinc alloy). Ion etching using Ga+ ions was used to expose the interfacial region. Ion fragments from the samples were examined carefully where supposed metal-oxygen-silicon ion fragments should appear in the mass spectra. From high mass resolution spectra it was concluded that there exists an AlOSi+ ion fragment at nominal mass m/z = 71 amu on the aluminium and aluminium-zinc alloy substrates and a ZnOSi+ ion fragment at nominal mass m/z = 108 amu on the zinc and aluminium-zinc alloy substrates. These results are further enhanced by the fact that the characteristic ion pattern of ZnOSi+-type ion fragments, composed of different naturally stable zinc and silicon isotopes, in the mass range m/z = 108-112 amu showed the expected relative peak height relations.
The presence of these metal-oxygen-silicon ion fragments is a strong indication that chemical interaction between the silane and the metal substrates exists and that the nature of this interaction is due to the formation of a covalent bond between the silane and the metal substrate. Copyright © 2001 John Wiley & Sons, Ltd.
Authors
Ulf Bexell
Högskolan Dalarna; Materialvetenskap
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Mikael Olsson
Högskolan Dalarna; Materialvetenskap
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identifier: oai:dalea.du.se:2675
datestamp: 2021-04-15T12:53:00Z
setSpec: SwePub-du
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recordCreationDate: 2007-04-04
identifier: http://urn.kb.se/resolve?urn=urn:nbn:se:du-2675
titleInfo:
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lang: eng
title: Characterisation of a Non-Organofunctional Silane Film Deposited on Al Zn and Al-43.4Zn-1.6Si Alloy Coated Steel Part II. Interfacial Characterization by ToF-SIMS and AES
abstract: Time-of-flight secondary ion mass spectrometry (ToF-SIMS) has been used to analyse the interface between a non-organofunctional silane and three different metal substrates (aluminium zinc and an aluminium-zinc alloy). Ion etching using Ga+ ions was used to expose the interfacial region. Ion fragments from the samples were examined carefully where supposed metal-oxygen-silicon ion fragments should appear in the mass spectra. From high mass resolution spectra it was concluded that there exists an AlOSi+ ion fragment at nominal mass m/z = 71 amu on the aluminium and aluminium-zinc alloy substrates and a ZnOSi+ ion fragment at nominal mass m/z = 108 amu on the zinc and aluminium-zinc alloy substrates. These results are further enhanced by the fact that the characteristic ion pattern of ZnOSi+-type ion fragments composed of different naturally stable zinc and silicon isotopes in the mass range m/z = 108-112 amu showed the expected relative peak height relations. \nThe presence of these metal-oxygen-silicon ion fragments is a strong indication that chemical interaction between the silane and the metal substrates exists and that the nature of this interaction is due to the formation of a covalent bond between the silane and the metal substrate. Copyright © 2001 John Wiley & Sons Ltd.
subject:
@attributes:
lang: eng
topic: metal substrates; silane films; AES; interfacial bonding; ToF-SIMS
language:
languageTerm: eng
genre:
publication/journal-article
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Published
2
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Bexell
Ulf
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Högskolan Dalarna
Materialvetenskap
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Olsson
Mikael
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Högskolan Dalarna
Materialvetenskap
nameIdentifier: mol
originInfo:
dateIssued: 2001
relatedItem:
@attributes:
type: host
titleInfo:
title: Surface and Interface Analysis
identifier:
0142-2421
1096-9918
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detail:
@attributes:
type: volume
number: 31
@attributes:
type: issue
number: 3
extent:
start: 223
end: 231
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form: print
typeOfResource: text