Polarization-resolved dual-view holographic system for 3D inspection of scattering particles

Document identifier: oai:DiVA.org:ltu-76067
Access full text here:10.1364/AO.58.000G31
Keyword: Natural Sciences, Physical Sciences, Atom and Molecular Physics and Optics, Naturvetenskap, Fysik, Atom- och molekylfysik och optik, Engineering and Technology, Mechanical Engineering, Applied Mechanics, Teknik och teknologier, Maskinteknik, Teknisk mekanik, Experimentell mekanik, Experimental Mechanics
Publication year: 2019
Abstract:

A novel dual-view polarization-resolved pulsed holographic system for particle measurements is presented. Both dual-view configuration and polarization-resolved registration are well suited for particle holography. Dual-view registration improves the accuracy in the detection of 3D position and velocities, and polarization-resolved registration provides polarization information about individual particles. The necessary calibrations are presented, and aberrations are compensated for by mapping the positions in the two views to positions in a global coordinate system. The system is demonstrated on a sample consisting of 7 μm spherical polystyrene particles dissolved in water in a cuvette. The system is tested with different polarizations of the illumination. It is found that the dual view improves the accuracy significantly in particle tracking. It is also found that by having polarization-resolved holograms, it is possible to separate naturally occurring sub-micrometer particles from the larger, 7 μm seeding particles.

Authors

Johan Öhman

Luleå tekniska universitet; Strömningslära och experimentell mekanik
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Per Gren

Luleå tekniska universitet; Strömningslära och experimentell mekanik
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Mikael Sjödahl

Luleå tekniska universitet; Strömningslära och experimentell mekanik
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